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Exhibitions and Conferences
Instrumentation and components
C.Scapellati
High Voltage Power Supplies for Analytical Instrumentation Power supply requirements for Analytical Instrumentation are as varied as the applications themselves ranging from 3 volts to 300,000 volts.While most voltage requirements can be satisfied with “off the shelf” products, the high voltage requirements are usually addressed by a custom design for a specific application. Custom designed high voltage power supplies can be found in instruments for spectroscopy, capillary electrophoresis, mass spectrometry, electrospray, lasers, spectrometers, X-ray diffraction, X-ray fluorescence, and many other analytical imaging and process applications.
Specific performance concerns, technology advances and application information are presented for the designer, customer and user of high voltage power supplies for analytical instrumentation in the present article.
High Voltage Power Supplies for Analytical Instrumentation Power supply requirements for Analytical Instrumentation are as varied as the applications themselves ranging from 3 volts to 300,000 volts.While most voltage requirements can be satisfied with “off the shelf” products, the high voltage requirements are usually addressed by a custom design for a specific application. Custom designed high voltage power supplies can be found in instruments for spectroscopy, capillary electrophoresis, mass spectrometry, electrospray, lasers, spectrometers, X-ray diffraction, X-ray fluorescence, and many other analytical imaging and process applications.
Specific performance concerns, technology advances and application information are presented for the designer, customer and user of high voltage power supplies for analytical instrumentation in the present article.
Tags: high voltage power supplies inverter power stage transformer высоковольтные источники тока инвертор силовой каскад трансформатор
V.Vasilyiev, A.Maltsev, A.Vinokurov
Mass-Spectrometer GC/MS Instrumental Detection Limit: Practice in Application of Special Design Bureau chromatec’s Mass-Spectrometers The problem Instrumental Detection Limit (IDL) evaluation for mass-spectrometers and its comparison with Signal to Noise Ratio (S/N or SNR) is sufficient enough discussed in different scientifical sources. In this article we consider practical aspects of IDL sensitivity evaluation in the process of manufacturing GC/MS systems at “Chromatec” company, Yoshkar-Ola. IDL criterion in various modes and the new method pros and cons are discussed.
Mass-Spectrometer GC/MS Instrumental Detection Limit: Practice in Application of Special Design Bureau chromatec’s Mass-Spectrometers The problem Instrumental Detection Limit (IDL) evaluation for mass-spectrometers and its comparison with Signal to Noise Ratio (S/N or SNR) is sufficient enough discussed in different scientifical sources. In this article we consider practical aspects of IDL sensitivity evaluation in the process of manufacturing GC/MS systems at “Chromatec” company, Yoshkar-Ola. IDL criterion in various modes and the new method pros and cons are discussed.
Tags: instrumental detection limit (idl) mass-spectrometer sensitivity evaluation signal to noise ratio (snr) инструментальный предел обнаружения определение чувствительности отношение сигнал/шум хромато-масс-спектрометр
Methodology
N.Safronova, H.Grishantseva, E.Silkis
Using Atomic Emission Spectroscopy with Mors’ Photoelectron Detector for ecologo-geochemical objects elementary analysis In-situ determination of inorganic microcomponents in such ecologo-geochemical objects as bottom deposits, suspended matters, planting media and ground and aquatic vegetation is an important but a hard task. These objects are increasingly complex multicomponent systems consisting of inorganic macro and microcomponents, high molecular weight organic humus type compounds, low molecular weight organic compounds as well as complex compounds. Authors describe the atomic emission spectroscopy capabilities when using the upgraded system AI-3K-Resonance with photoelectron detector Mors-9. Software permits objects spectrum computer processing and microcomponents rapid quantity analysis.
Using Atomic Emission Spectroscopy with Mors’ Photoelectron Detector for ecologo-geochemical objects elementary analysis In-situ determination of inorganic microcomponents in such ecologo-geochemical objects as bottom deposits, suspended matters, planting media and ground and aquatic vegetation is an important but a hard task. These objects are increasingly complex multicomponent systems consisting of inorganic macro and microcomponents, high molecular weight organic humus type compounds, low molecular weight organic compounds as well as complex compounds. Authors describe the atomic emission spectroscopy capabilities when using the upgraded system AI-3K-Resonance with photoelectron detector Mors-9. Software permits objects spectrum computer processing and microcomponents rapid quantity analysis.
Tags: atomic emission spectroscopy analysis current generator resonsnce geochemical objects photoelectron charger mors-9 software spill-insufflation method атомно-эмиссионный спектральный анализ генератор тока "резонанс" геохимические объекты метод просыпки-вдувания программное обеспечение фотоэлектронная кассета морс-9
A.Grishina, V.Zolotarevskiy, A.Vannikov
Research of supramolecular ensembles of metal-porphyrinates with atomic force microscopy method. The problem of new materials synthesis with photorefractive properties is the order of the day. Photorefractive effect is exhibited in the crystals and the polymer composite matrices under action of the laser radiation and consists in the change of refractive index. In the present work the properties of solid state photorefractive composite material consisting from supramolecular ensembles of complex (R4Pc)Ru(TED)2 with a high glass transition temperature. Photorefractive effect is connected with a high non-linear optic susceptibility of third order and photoelectric and photorefractive sensitivity manifests itself in near infra-red zone.
Research of supramolecular ensembles of metal-porphyrinates with atomic force microscopy method. The problem of new materials synthesis with photorefractive properties is the order of the day. Photorefractive effect is exhibited in the crystals and the polymer composite matrices under action of the laser radiation and consists in the change of refractive index. In the present work the properties of solid state photorefractive composite material consisting from supramolecular ensembles of complex (R4Pc)Ru(TED)2 with a high glass transition temperature. Photorefractive effect is connected with a high non-linear optic susceptibility of third order and photoelectric and photorefractive sensitivity manifests itself in near infra-red zone.
Tags: afm photorefractive effect polymer composite material supramolecular ensembles атомно-силовая микроскопия композитный материал молекулярный комплекс фоторефрактивный эффект
Y.Kalambet, S.Maltsev
Confidence intervals in the case of weighted ordinary least squares (OLS) regression. The theory of calibration confidence intervals in some cases of heteroscedastic error is presented. Implementation of the theory in Chrom&Spec Chromatography Data Station is described. The cases of constant absolute and relative error, as well as error proportional to square root of the signal are investigated. General case of confidence interval for unequal (heteroscedastic) measurement error are discussed.
Confidence intervals in the case of weighted ordinary least squares (OLS) regression. The theory of calibration confidence intervals in some cases of heteroscedastic error is presented. Implementation of the theory in Chrom&Spec Chromatography Data Station is described. The cases of constant absolute and relative error, as well as error proportional to square root of the signal are investigated. General case of confidence interval for unequal (heteroscedastic) measurement error are discussed.
Tags: confidential interval dispersion standard deviation. calibration градуировка дисперсия доверительный интервал стандартное отклонение
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