rus
TS_pub
technospheramag
technospheramag
ТЕХНОСФЕРА_РИЦ
DOI: 10.22184/2227-572X.2020.10.2.124.130
The article is based on the material of the author’s plenary report at the III All-Russian Conference on Analytical Spectroscopy. The reason for its writing was the fact that the author, in the process of reviewing many scientific papers, came across completely unacceptable results of electron probe microanalysis (EPMA) obtained with modern instruments. Today, a significant part of electron microscopes is equipped with energy dispersive X ray spectrometers (EDS) with appropriate mathematical software. As a result of this, an additional opportunity arises – conducting a EPMA the studied object. The manuals for using these spectrometers offer a fairly simple and fast analysis algorithm, usually without any reference samples (RS). This approach is called standardless analysis (SA). The development of SA and the problem of correct definitions are discussed.
The article is based on the material of the author’s plenary report at the III All-Russian Conference on Analytical Spectroscopy. The reason for its writing was the fact that the author, in the process of reviewing many scientific papers, came across completely unacceptable results of electron probe microanalysis (EPMA) obtained with modern instruments. Today, a significant part of electron microscopes is equipped with energy dispersive X ray spectrometers (EDS) with appropriate mathematical software. As a result of this, an additional opportunity arises – conducting a EPMA the studied object. The manuals for using these spectrometers offer a fairly simple and fast analysis algorithm, usually without any reference samples (RS). This approach is called standardless analysis (SA). The development of SA and the problem of correct definitions are discussed.
Теги: electron microscope electron probe microanalysis energy dispersive x ray spectrometers standardless analysis безэталонный анализ электрозондовый микроанализ электронный микроскоп энергодисперсионные рентгеновские спектрометры
Standardless X ray Spectral Analysis: Reality or Myth?
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